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NAND Flash Bad Block Schemes

This software suite includes several different bad block management schemes needed for loading data patterns  into NAND devices.

Product Specification (PDF)

Product Description   

Maximize
  • Field Proven
  • Skip Block method is the default scheme
  • Runs under TLWIN
  • References device specs from the semiconductor manufacturers
  • General schemes (Reserved Block Area, Samsung GBBM...)
  • Also developed for unique customer applications