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X-Ray Inspection and its Effect on NAND Flash Memory

Tuesday, December 11, 2018

Production bottlenecks and high cost of programming large files at test make preprogramming the preferred method for production managers building product using high-density eMMC NAND flash. While there are several well documented papers to validate that X-Ray inspection can impact data retention in preprogrammed eMMC NAND devices, little is mentioned regarding technology advancements designed to correct eMMC data retention errors including bit-flips. This paper is intended to help production managers better understand eMMC NAND with a focus on the technology safeguards and recommended best practices to ensure data integrity from the time the eMMC device is preprogrammed to final product. Error correction code (ECC) enabled eMMC devices preserve data integrity and are essentially immune to “reasonable” doses of irradiation.

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